DISPLAY MICRO TEST SOLUTION

MEMS BASED ULTRA FILM AND MEMS BLADE PROBE UNIT

SOLUTIONS

This is the core part that makes its probes contact with the electrodes of the display (OLED/LCD) panel and applies the electric signals to it to determine whether the panel is defective or not. WithMEMS Co., Ltd. provides differentiated, high-precision test solutions for various display panels through Ultra Film (UF) products and MEMS Blade products based on based on its proprietary Through Polyimide Via (TPV) process technology.

  • · Ultra Film Probe Unit
  • · MEMS Blade Probe Unit
  • · u-LED Probe Unit , etc
Array Test
Cell Test

PROBE UNIT SOLUTIONS

FILM
P/U
UF-S · Ultra Film–Special
· Probing solution for ultra-fine pitch display » under 25um pitch
· Full Contact type
UF-N · Ultra Film–Normal
· Probe Unit for General Pitch Panel » above 25um pitch
UF-L · Ultra Film–Low Cost
· Low Cost solution (shorting bar application)
· Pogo type alternative
UF-R · Ultra Film–Thin Film Resist (Fuse function)
· Solution to prevent panel contact ‘bunt’
· LSF probe unit for High Voltage TV
BLADE
P/U
M-BLADE · MEMS Blade Type P/U
· Material : NiCo
E-BLADE · Etching Blade Type P/U
· Material : BeCu

ULTRA FILM PROBE UNIT

  • • Excellent contact bump reliability (Implementation of bump using Through Polyimide Via (TPV) technology)
  • • Fine pitch product compatibility (compatible with 11 um-grade fine pitch)
  • • Flexible application with various multi-pattern structures
  • • Manufacture of core parts through its own MEMS FAB (short lead time and cost competitiveness)
Specification of Ultra Film Probe Unit
Ultra Film Remark
Material Polyimide / NiCo (Bump)
Dimension(Bump Size) W12 x L38 x H15um Changeable according to designs
Accuracy X ± 5um
Y ± 5um
Z ± 1um
Life Time 50K Changeable depending on usage environment
Contact Force 5~10g/Pin O/D 200um
Contact Resistance ≤2Ω
Leakage ≤5nA(DC 10V Input)
Capacitance ≤20pF
C.C.C Pattern W=10um 150mA Based on pattern thickness of 5um
Pattern W=15um 200mA
Scrub Amount ≤15um Low Scrub

MEMS BLADE PROBE UNIT

  • • Differentiated MEMS blade structure ensures excellent contact reliability
  • • Integrated Ceramic Slit structure implements superior alignment precision
  • • Advantageous with easy block assembly and repair
  • • Manufacture of core parts through its own MEMS FAB (short lead time and cost competitiveness)
Specification of MEMS Blade Probe Unit
MEMS Blade Remark
Material NiCo
Dimension(Pin Thickness) ≥15um
Accuracy X ± 10um
Y ± 10um
Z ± 10um
Life Time 300K Changeable depending on usage environment
Contact Force 2.5~5g/Pin O/D 150um
Contact Resistance ≤2Ω
Leakage ≤10nA(DC 10V Input)
Capacitance ≤30pF
C.C.C Thickness=15um 300mA
Thickness=25um 450mA
Scrub Amount ≤30um

PRODUCTS

LCD Fine Pitch Contact
LCD Cell Full Contact
LCD In-Cell Full Contact
OLED Cell Contact
OLED Cell Full Contact
OLED Array Contact
OLED Array Contact
OLED Array Full Contact
LCD Array Contact
LCD Array Full Contact
Diode LED Module Test
Diode LED Module Test

CONTACT US

If you have any questions regarding Display Probe Unit, please feel free to contact us.

TEL

+82-31-370-3230

E-Mail

jkpark@withmems.com

FAX

+82-31-370-3299