DISPLAY MICRO TEST SOLUTION

MEMS BASED ULTRA FILM AND MEMS BLADE PROBE UNIT

SOLUTIONS

通过在显示(OLED/LCD)面板的电极上连接探针,收发电气信号,是判断面板不良与否的核心部件,WithMEMS股份有限公司通过独有的基于TPV(Through Polyimide Via)工艺技术的UF(Ultra Film)产品及MEMS Blade产品,提供关于各种显示面板的与众不同的高精密测试解决方案。

  • · Ultra Film Probe Unit
  • · MEMS Blade Probe Unit
  • · u-LED Probe Unit , etc
Array Test
Cell Test

PROBE UNIT SOLUTIONS

FILM
P/U
UF-S · Ultra Film–Special
· Probing solution for ultra-fine pitch display » under 25um pitch
· Full Contact type
UF-N · Ultra Film–Normal
· Probe Unit for General Pitch Panel » above 25um pitch
UF-L · Ultra Film–Low Cost
· Low Cost solution (shorting bar application)
· Pogo type alternative
UF-R · Ultra Film–Thin Film Resist (Fuse function)
· Solution to prevent panel contact ‘bunt’
· LSF probe unit for High Voltage TV
BLADE
P/U
M-BLADE · MEMS Blade Type P/U
· Material : NiCo
E-BLADE · Etching Blade Type P/U
· Material : BeCu

ULTRA FILM PROBE UNIT

  • • 优秀的Contact Bump可靠性(利用TPV穿透技术实现Bump)
  • • Fine Pitch产品应对能力(应对11μm级Fine Pitch)
  • • 应用多种Multi-Pattern结构的灵活性
  • • 通过自主MEMS FAB制造核心部件(缩短研制周期和提高成本竞争力)
Specification of Ultra Film Probe Unit
Ultra Film Remark
Material Polyimide / NiCo (Bump)
Dimension(Bump Size) W12 x L38 x H15um 可根据设计变更
Accuracy X ± 5um
Y ± 5um
Z ± 1um
Life Time 50K 根据具体使用环境,可能会有所不同
Contact Force 5~10g/Pin O/D 200um
Contact Resistance ≤2Ω
Leakage ≤5nA(DC 10V Input)
Capacitance ≤20pF
C.C.C Pattern W=10um 150mA Pattern Thick 5μm标准
Pattern W=15um 200mA
Scrub Amount ≤15um Low Scrub

MEMS BLADE PROBE UNIT

  • • 采用与众不同的MEMS Blade结构,确保优秀的连接可靠性
  • •一体式Ceramic Slit结构,实现优秀的Align精密度
  • • 有利于应对Easy Block装配与Easy Repair
  • • 通过自主MEMS FAB制造核心部件(缩短研制周期和提高成本竞争力)
Specification of MEMS Blade Probe Unit
MEMS Blade Remark
Material NiCo
Dimension(Pin Thickness) ≥15um
Accuracy X ± 10um
Y ± 10um
Z ± 10um
Life Time 300K 根据具体使用环境,可能会有所不同
Contact Force 2.5~5g/Pin O/D 150um
Contact Resistance ≤2Ω
Leakage ≤10nA(DC 10V Input)
Capacitance ≤30pF
C.C.C Thickness=15um 300mA
Thickness=25um 450mA
Scrub Amount ≤30um

PRODUCTS

LCD Fine Pitch Contact
LCD Cell Full Contact
LCD In-Cell Full Contact
OLED Cell Contact
OLED Cell Full Contact
OLED Array Contact
OLED Array Contact
OLED Array Full Contact
LCD Array Contact
LCD Array Full Contact
Diode LED Module Test
Diode LED Module Test

CONTACT US

如果对显示器探针单元(Probe Unit)有任何疑问,敬请垂询。

TEL

+82-31-370-3230

E-Mail

jkpark@withmems.com

FAX

+82-31-370-3299